EDI9F416128C
FIG. 5
WRITE CYCLE 2 - E CONTROLLED
A
TAVEL
E
W
D
Q
9F416128C Write Cyc2
TAVAV
TELEH
TAVEH
TWLEH
TEHAX
HIGH Z
TDVEH
TEHDX
DATA VALID
DATA RETENTION CHARACTERISTICS
Characteristic
Data Retention Voltage
Data Retention Quiescent Current
Sym
VDD
ICCDR
Chip Disable to Data Retention Time(1) TCDR
Operation Recovery Time (1)
TR
Test Conditions VDD Min Typ
VDD = 0.2V
2
--
E VDD -0.2V
2V
--
1
VIN VDD -0.2V 3V
--
1
or VIN 0.2V
0
--
5
--
Max
Unit
V
6
µA
8
µA
--
ns
--
ms
FIG. 6
DATA RETENTION - E CONTROLLED
VCC
E
DATA RETENTION MODE
4.5V
VDD
4.5V
TCDR
TR
E ≥ VDD-0.2V
9F416128C Data Retent.
Aug. 2002 Rev. 2A
ECO #15521
5
White Electronic Designs Corporation (508) 366-5151 www.whiteedc.com