Philips Semiconductors
Hex inverter
Product specification
HEF4069UB
gates
Fig.12 Test set-up for measuring forward transconductance gfs = dio/dvi at vo is constant (see also graph
Fig.13).
A : average,
B : average + 2 s,
C : average − 2 s, where:
‘s’ is the observed standard
deviation.
Fig.13 Typical forward transconductance gfs as a function of the supply voltage at Tamb = 25 °C.
January 1995
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