TA7267 Ver la hoja de datos (PDF) - Toshiba

Número de pieza

componentes Descripción

fabricante

TA7267

TOSHIBA Bipolar Linear Integrated Circuit Silicon Monolithic

Toshiba 

Test Circuit

TA7267BP

TA7267BP

Test Method

Charac−

Teristics

ICC1

ICC2

ICC2

ICC3

VS1 U

VS1 U

VS1 L

VS1 L

VS2 U

VS2 U

VS2 L

VS2 L

VTH1

VTH2

ISC

IIN1

IIN2

SW1

SW2

CLOSE

CLOSE

CLOSE

CLOSE

CLOSE

CLOSE

CLOSE

CLOSE

CLOSE

CLOSE

CLOSE

CLOSE

CLOSE

CLOSE

CLOSE

OPEN

OPEN

OPEN

OPEN

OPEN

OPEN

CLOSE

CLOSE

CLOSE

CLOSE

CLOSE

CLOSE

CLOSE

CLOSE

CLOSE

CLOSE

CLOSE

CLOSE

CLOSE

SW3

b

a

b

a

b

a

b

a

b

a

b

a

a

b

a

a

b

SW4

b

b

a

a

a

b

a

b

a

b

a

b

b

a

b

b

a

SW5

a

a

a

a

b

b

b

b

c

c

c

c

b

b

b

b

b

SW6

c

c

c

c

a

b

c

c

a

b

c

c

c

c

c

c

c

SW7

c

c

c

c

c

c

b

a

c

c

b

a

c

c

c

c

c

SW8

a

a

a

a

a

a

a

a

a

a

a

a

b

b

a

a

a

SW9

Test Meter

a

a

A1 Use

a

a

a

V1 Use, IO = 0.1 A

a

a

V2 Use, IO = 0.1 A

a

a

V1 Use, IO = 1 A

a

a

V2 Use, IO = 1 A

a

a

V3 Use function check

a

b A3 Use, SW10 = close

a

A2 Use

a

6

2007-2-28

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