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MC14094BFR1

8-Stage Shift/Store Register with Three-State Outputs

ON Semiconductor 

MC14094B

3–STATE TEST CIRCUIT

FOR tPHZ AND tPZH

VSS

FOR tPLZ AND tPZL

VDD

O.E.

DATA

ST

CLOCK

1k

OUTPUT

50 pF

2

*

SERIAL

DATA IN

15

*

OUTPUT

ENABLE

3

*

CLOCK

1

*

STROBE

CLOCK

BLOCK DIAGRAM

REGISTER STAGE 1

CLOCK

LATCH 1

STROBE

CLOCK

CLOCK

STROBE STROBE

CLOCK

CLOCK

STROBE

2

REGISTER STAGE 2

3

REGISTER STAGE 3

4

REGISTER STAGE 4

5

REGISTER STAGE 5

6

REGISTER STAGE 6

7

REGISTER STAGE 7

LATCH 2

LATCH 3

LATCH 4

LATCH 5

LATCH 6

LATCH 7

3-STATE BUFFER 1

VDD

4 Q1

3-STATE BUFFERą2

3-STATE BUFFERą3

3-STATE BUFFERą4

3-STATE BUFFERą5

3-STATE BUFFERą6

3-STATE BUFFERą7

5 Q2

6 Q3

7 Q4

14 Q5

13 Q6

12 Q7

8

REGISTER STAGE 8

CLOCK

CLOCK

CLOCK

STROBE

STROBE

CLOCK

*Input Protection Diodes

LATCH 8

CLOCK

STROBE STROBE

3-STATE BUFFERą8

CLOCK

CLOCK

CLOCK

11 Q8

10 Q′S

9 QS

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