NJU7708/09
TEST CIRCUIT
Quiescent Current TEST CIRCUIT
ISS A
V DD
NJM7708
V OUT
D1
VSS
D2
Detection Voltage
/Minimum Operating Voltage TEST CIRCUIT
V DET /
V OP L
V
V DD
V DD
NJM7708
V OUT
D1
VSS
D2
RL
V VOUT
Leak Current/Output Current TEST CIRCUIT Delay Time=0mS TEST CIRCUIT
Oscilloscope
V DD
V OUT
NJM7708
V DD
D1
VSS
D2
IOUT /
ILEAK
A
V OUT /
V DS
RL
ch1 ch2
V DD
V OUT
V DD
NJM7708
D1
VSS
D2
Delay Time=50mS TEST CIRCUIT
Delay Time=100mS TEST CIRCUIT
Oscilloscope
Oscilloscope
RL
ch1 ch2
RL
ch1 ch2
V DD
V OUT
V DD
NJM7708
V DD
V OUT
V DD
NJM7708
D1
VSS
D2
D1
VSS
D2
-4-
Ver.2004-03-09