NB100EP223 Ver la hoja de datos (PDF) - ON Semiconductor

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NB100EP223

3.3V1:22 Differential HSTL/PECL to HSTL Clock Driver with LVTTL Clock Select and Output Enable

ON Semiconductor 

NB100EP223

VCC

GND

CLK_SEL

HSTL_CLK

0

HSTL_CLK

LVPECL_CLK

1

LVPECL_CLK

OE

Q

D

Figure 2. Logic Diagram

22 Q0−Q21 (HSTL)

22 Q0−Q21 (HSTL)

VCCO

Table 3. ATTRIBUTES

Characteristics

Value

Internal Input Pulldown Resistor

75 kW

Internal Input Pullup Resistor

37.5 kW

ESD Protection

Human Body Model

Machine Model

Charged Device Model

> 2 kV

> 150 V

> 2 kV

Moisture Sensitivity (Note 1)

Pb Pkg

Pb−Free Pkg

LQFP−64

Level 2

Level 3

Flammability Rating

Oxygen Index: 28 to 34

UL 94 V−0 @ 0.125 in

Transistor Count

693

Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test

1. For additional information, refer to Application Note AND8003/D.

Table 4. MAXIMUM RATINGS

Symbol

Parameter

Condition 1

Condition 2

Rating

Unit

VCC

VCCO

VI

Iout

Core Power Supply

HSTL Output Power Supply

PECL Mode Input Voltage

Output Current

GND = 0 V

GND = 0 V

GND = 0 V

Continuous

Surge

VCCO = 1.8 V

VCC = 3.3 V

VI ≤ VCC

4

V

4

V

4

V

50

mA

100

mA

TA

Operating Temperature Range

Tstg

Storage Temperature Range

qJA

Thermal Resistance (Junction−to−Ambient) 0 lfpm

(See Application Information)

500 lfpm

64 LQFP

64 LQFP

0 to +85

−65 to +150

35.6

30

°C

°C

°C/W

°C/W

qJC

Thermal Resistance (Junction−to−Case) 0 lfpm

(See Application Information)

500 lfpm

64 LQFP

64 LQFP

3.2

°C/W

6.4

°C/W

Tsol

Wave Solder

Pb

Pb−Free

265

°C

265

Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the

Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect

device reliability.

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