MC100EP195FA Ver la hoja de datos (PDF) - ON Semiconductor
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MC100EP195FA Datasheet PDF : 20 Pages
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MC10EP195, MC100EP195
14000.0
13000.0
12000.0
11000.0
10000.0
9000.0
8000.0
7000.0
VCC = 0 V
VEE = −3.3 V
6000.0
5000.0
4000.0
3000.0
2000.0
1000.0
0.0
0.0
100.0 200.0
300.0
400.0
500.0
25°C
600.0 700.0
85°C
−40°C
800.0 900.0 1000.0
Decimal Value of Select Inputs (D[9:0])
Figure 4. Measured Delay vs. Select Inputs
Table 7. MAXIMUM RATINGS
Symbol
Parameter
Condition 1
Condition 2
Rating
Unit
VCC
Positive Mode Power Supply
VEE
Negative Mode Power Supply
VI
Positive Mode Input Voltage
Negative Mode Input Voltage
Iout
Output Current
VEE = 0 V
VCC = 0 V
VEE = 0 V
VCC = 0 V
Continuous
Surge
VI ≤ VCC
VI ≥ VEE
6
V
−6
V
6
V
−6
V
50
mA
100
mA
IBB
VBB Sink/Source
TA
Operating Temperature Range
Tstg
Storage Temperature Range
qJA
Thermal Resistance (Junction−to−Ambient)
0 lfpm
500 lfpm
LQFP−23
LQFP−23
±0.5
−40 to +85
−65 to +150
80
55
mA
°C
°C
°C/W
°C/W
qJC
Thermal Resistance (Junction−to−Case)
qJA
Thermal Resistance (Junction−to−Ambient)
Standard Board
0 lfpm
500 lfpm
LQFP−23
QFN−32
QFN−32
12 to 17
31
27
°C/W
°C/W
°C/W
qJC
Thermal Resistance (Junction−to−Case)
2S2P
QFN−32
Tsol
Wave Solder
Pb <2 to 3 sec @ 248°C
Pb−Free <2 to 3 sec @ 260°C
12
°C/W
265
°C
265
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
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