MC10EL35, MC100EL35
J1
J
K2
K
8 VCC
7Q
CLK 3
R
R4
6Q
5 VEE
Figure 1. Logic Diagram and Pinout Assignment
Table 1. PIN DESCRIPTION
PIN
FUNCTION
J
ECL Input
K
ECL Input
R
ECL Reset
CLK
ECL Clock Input
Q, Q
ECL Data Outputs
VCC
Positive Supply
VEE
Negative Supply
EP
Exposed pad must be connected to a sufficient
thermal conduit. Electrically connect to the
most negative supply or leave floating open.
Table 1. TRUTH TABLE
J*
K*
R*
L
L
L
L
H
L
H
L
L
H
H
L
X
X
H
CLK
Z
Z
Z
Z
X
Qn+1
Qn
L
H
Qn
L
Table 2. MAXIMUM RATINGS
Symbol
Parameter
Condition 1
Condition 2
Rating
Unit
VCC
PECL Mode Power Supply
VEE
NECL Mode Power Supply
VI
PECL Mode Input Voltage
NECL Mode Input Voltage
Iout
Output Current
VEE = 0 V
VCC = 0 V
VEE = 0 V
VCC = 0 V
Continuous
Surge
VI VCC
VI VEE
8
V
−8
V
6
V
−6
V
50
mA
100
mA
TA
Operating Temperature Range
Tstg
Storage Temperature Range
qJA
Thermal Resistance (Junction−to−Ambient) 0 lfpm
500 lfpm
8 SOIC
8 SOIC
−40 to +85
−65 to +150
190
130
°C
°C
°C/W
°C/W
qJC
Thermal Resistance (Junction−to−Case)
Standard Board
8 SOIC
qJA
Thermal Resistance (Junction−to−Ambient) 0 lfpm
500 lfpm
8 TSSOP
8 TSSOP
41 to 44
185
140
°C/W
°C/W
°C/W
qJC
Thermal Resistance (Junction−to−Case)
Standard Board
8 TSSOP
qJA
Thermal Resistance (Junction−to−Ambient) 0 lfpm
500 lfpm
DFN8
DFN8
41 to 44 ± 5%
129
84
°C/W
°C/W
°C/W
Tsol
Wave Solder
Pb <2 to 3 sec @ 248°C
Pb−Free <2 to 3 sec @ 260°C
265
°C
265
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
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