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LTC4365CDDBTRMPBF Ver la hoja de datos (PDF) - Linear Technology

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fabricante
LTC4365CDDBTRMPBF
Linear
Linear Technology 
LTC4365CDDBTRMPBF Datasheet PDF : 16 Pages
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LTC4365
APPLICATIONS INFORMATION
The trace at VOUT, on the other hand, does not respond
to the negative voltage at VIN, demonstrating the desired
reverse supply protection. The waveforms of Figure 7 were
captured using a 40V dual N-channel MOSFET, a 10μF
ceramic output capacitor and no load current on VOUT.
Recovery Timer
The LTC4365 has a recovery delay timer that filters noise
at VIN and helps prevent chatter at VOUT. After either an OV
or UV fault has occurred, the input supply must return to
the desired operating voltage window for at least 36ms in
order to turn the external MOSFET back on as illustrated
in Figures 4 and 5.
Going out of and then back into fault in less than 36ms
will keep the MOSFET off continuously. Similarly, coming
out of shutdown (SHDN low to high) triggers an 800μs
start-up delay timer (see Figure 10).
The recovery timer is also active while the LTC4365 is
powering up. The 36ms timer starts once VIN rises above
VIN(UVLO) and VIN lies within the user selectable UV/OV
power good window. See Figure 8.
VIN
VIN(UVLO)
tRECOVERY
GATE
MOSFET OFF
MOSFET ON
4365 F08
Figure 8. Recovery Timing During Power-On
(OV = GND, UV = SHDN = VIN)
Gentle Shutdown
The SHDN input turns off the external MOSFETs in a
gentle, controlled manner. When SHDN is asserted low,
a 90μA current sink slowly begins to turn off the external
MOSFETs.
Once the voltage at the GATE pin falls below the voltage
at the VOUT pin, the current sink is throttled back and a
feedback loop takes over. This loop forces the GATE voltage
to track VOUT, thus keeping the external MOSFETs off as
VOUT decays. Note that when VOUT < 4.5V, the GATE pin
is pulled to within 400mV of ground.
Gentle gate turn off reduces load current slew rates and
mitigates voltage spikes due to parasitic inductances.
To further decrease GATE pin slew rate, place a capaci-
tor across the gate and source terminals of the external
MOSFETs. The waveforms of Figure 9 were captured using
the Si4230 dual N-channel MOSFETs, and a 2A load with
100μF output capacitor.
GATE
VOUT
5V/DIV
SHDN
GND
VIN = 12V
T = 25°C
100μs/DIV
4365 F9
Figure 9. Gentle Shutdown: GATE Tracks VOUT as
VOUT Decays
FAULT Status
The FAULT high voltage open drain output is driven low if
SHDN is asserted low, if VIN is outside the desired UV/OV
voltage window, or if VIN has not risen above VIN(UVLO).
Figures 4, 5 and 10 show the FAULT output timing.
SHDN
GATE
VOUT
FAULT
ΔVGATE
tGATE(SLOW)
tSTART
GATE = VOUT
tSHDN(F)
Figure 10. Gentle Shutdown Timing
4365 F10
4365f
12

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