LTC1099(1989) Ver la hoja de datos (PDF) - Linear Technology

Número de pieza

componentes Descripción

fabricante

LTC1099
(Rev.:1989)

High Speed 8-Bit A/D Converter with Built-In Sample-and-Hold

Linear Technology 

LTC1099

PIN FUNCTIONS

VIN (Pin 1): Analog Input.

DB0 to DB3 (Pins 2 to 5): Data Outputs. DB0 = LSB.

WR/RDY (Pin 6): WR/RDY is an input when M0DE = VCC.

Falling edge of WR switches internal S/H to hold then

starts conversion. WR/RDY is an open drain output (active

pull-down) when M0DE = GND. RDY goes low at start of

conversion and pull-down is turned off when conversion

is complete. Resistive pull-up is usually used in this mode.

MODE (Pin 7): WR-RD when MODE = VCC. RD when

M0DE = GND. No internal pull-down.

RD (Pin 8): A Low on RD with CS Low Activates Three-

State Outputs. With MODE = GND and CS low, the falling

edge of RD switches internal S/H to hold and starts

conversion.

INT (Pin 9): Output that goes low when the conversion in

process is complete and goes high after data is read.

GND (Pin 10): Ground Connection.

REF– (Pin 11): Low Reference Potential (Analog Ground).

REF+ (Pin 12): High Reference Potential. VREF = Full Scale

= (REF+) – (REF–).

CS (Pin 13): Chip Select. When high, data outputs are high

impedance and all inputs are ignored.

DB4 to DB7 (Pins 14 to 17): Data Outputs. DB7 = MSB.

OFL (Pin 18): Overflow Output. Goes low when VIN > VREF.

TC (Pin 19): User Adjustable Conversion Time.

VCC (Pin 20): Positive Supply. 4.75V ≤ VCC ≤ 5.25V.

TEST CIRCUITS

VCC

RD

CS

VCC

RD

CS

DATA

OUT

CL 1k

t1H

tr = 20ns, CL = 10pF

VCC

RD

10%

GND

tr

90%

50%

t1H

V0H

90%

DATA OUT

GND

VCC

1k

CL

DATA

OUT

t0H

tr = 20ns, CL = 10pF

VCC

RD

GND 10%

tr

90%

50%

t0H

VCC

DATA OUT

V0L

10%

1099 F01

Figure 1. Three-State Test Circuit

5

Share Link: