HEF4000BF Ver la hoja de datos (PDF) - Philips Electronics
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HEF4000BF Datasheet PDF : 5 Pages
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Philips Semiconductors
Dual 3-input NOR gate and inverter
Product specification
HEF4000B
gates
Fig.7 Test set-up for measuring forward transconductance gfs = dio/dvi at vo is constant (see also graph Fig.8).
A: average
B: average + 2 s,
C: average − 2 s, in where ‘s’ is the observed standard deviation.
Fig.8 Typical forward transconductance gfs as a function of the supply voltage at Tamb = 25 °C.
January 1995
5
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