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DS3232M Ver la hoja de datos (PDF) - Maxim Integrated

Número de pieza
componentes Descripción
fabricante
DS3232M
MaximIC
Maxim Integrated 
DS3232M Datasheet PDF : 23 Pages
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DS3232M
±5ppm, I2C Real-Time Clock with SRAM
AC ELECTRICAL CHARACTERISTICS—POWER SWITCH
(TA = -40NC to +85NC, unless otherwise noted.) (Note 1, Figure 2)
PARAMETER
SYMBOL
CONDITIONS
VCC Fall Time, VPFMAX to
VPFMIN
VCC Rise Time, VPFMIN to
VPFMAX
Recovery at Power-Up
tVCCF
tVCCR
tREC
(Note 5)
MIN TYP MAX UNITS
300
Fs
0
Fs
250 300
ms
AC ELECTRICAL CHARACTERISTICS—I2C INTERFACE
(VCC or VBAT = +2.3V to +4.5V, TA = -40NC to +85NC, unless otherwise noted. Typical values are at VCC = +3.3V, VBAT = +3.0V, and
TA = +25NC, unless otherwise noted.) (Notes 1, 6, Figure 1)
PARAMETER
SYMBOL
CONDITIONS
MIN TYP MAX UNITS
SCL Clock Frequency
Bus Free Time Between STOP
and START Conditions
fSCL
tBUF
0
400
kHz
1.3
Fs
Hold Time (Repeated) START
Condition
tHD:STA
0.6
Fs
Low Period of SCL
High Period of SCL
Data Hold Time
Data Set-Up Time
START Set-Up Time
SDA and SCL Rise Time
SDA and SCL Fall Time
STOP Set-Up Time
SDA, SCL Input Capacitance
tLOW
tHIGH
tHD:DAT
tSU:DAT
tSU:STA
tR
(Note 7)
tF
tSU:STO
CBIN
(Note 7)
(Note 8)
1.3
Fs
0.6
Fs
0
0.9
Fs
100
ns
0.6
Fs
20 +
0.1CB
20 +
0.1CB
0.6
300
ns
300
ns
Fs
10
pF
Note 1: Limits are 100% tested at TA = +25°C and TA = +85°C. Limits over the operating temperature range and relevant supply
voltage range are guaranteed by design and characterization. Typical values are not guaranteed.
Note 2: Includes the temperature conversion current (averaged).
Note 3: Does not include RST leakage if VCC < VPF.
Note 4: The parameter tOSF is the period of time the oscillator must be stopped for the OSF flag to be set.
Note 5: The state of RST does not affect the I2C interface or RTC functions.
Note 6: Interface timing shown is for fast-mode (400kHz) operation. This device is also backward-compatible with standard mode
I2C timing.
Note 7: CB = total capacitance of one bus line in picofarads.
Note 8: Guaranteed by design and not 100% production tested.
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