CY14B101K-SP25XC Ver la hoja de datos (PDF) - Cypress Semiconductor

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CY14B101K-SP25XC

1 Mbit (128K x 8) nvSRAM With Real Time Clock

Cypress Semiconductor 

CY14B101K

Capacitance

These parameters are guaranteed but not tested.

Parameter

Description

Test Conditions

Max

CIN

Input Capacitance

TA = 25°C, f = 1 MHz,

7

COUT

Output Capacitance

VCC = 0 to 3.0 V

7

Thermal Resistance

These parameters are guaranteed but not tested.

Parameter

Description

ΘJA Thermal Resistance

(junction to ambient)

ΘJC Thermal Resistance

(junction to case)

Test Conditions

Test conditions follow standard test methods and

procedures for measuring thermal impedance, in

accordance with EIA/JESD51.

48-SSOP

TBD

TBD

Unit

pF

pF

Unit

°C/W

°C/W

AC Test Loads

3.0V

OUTPUT

30 pF

R1 577Ω

R2

789Ω

3.0V

OUTPUT

5 pF

R1 577Ω For Tri-state Specs

R2

789Ω

AC Test Conditions

Input Pulse Levels ..................................................0 V to 3 V

Input Rise and Fall Times (10% - 90%) ........................ <5 ns

Input and Output Timing Reference Levels ................... 1.5 V

Document Number: 001-06401 Rev. *G

Page 15 of 24

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