BD9006F, BD9006HFP, BD9007F, BD9007HFP
Technical Note
SW
VIN
VIN
SW
RT
Internal Power
VIN
RT
167kΩ
INV
Internal Power
VIN
INV
1kΩ
EN/SYNC
VIN
Internal Power
FB
VIN
Internal Power
EN/
SYNC
60kΩ
222
221
kΩ
kΩ
145
kΩ
139
kΩ
20Ω
FB
1kΩ
1kΩ
Fig.28 Equivalent circuit
●Notes for use
1. Absolute maximum ratings
If excess in the absolute maximum ratings, such as supply voltage, temperature range of operating conditions, etc., can break
down the devices, thus making impossible to identify breaking mode, such as a short circuit or an open circuit. If any over rated
values will expect to exceed the absolute maximum ratings, consider adding circuit protection devices, such as fuses.
2. GND potential
Ground-GND potential should maintain at the minimum ground voltage level. Furthermore, no terminals should be lower
than the GND potential voltage including electric transients.
3. Thermal design
Use a thermal design that allows for a sufficient margin in light of the power dissipation (Pd) in actual operating conditions.
4. Inter-pin shorts and mounting errors
When attaching to the set substrate, pay special attention to the direction and proper placement of the IC. If the IC is attached
incorrectly, it may be destroyed.
Furthermore, when using the IC with VIN and EN/SYNC terminals shorted, and the 5-pin (SOP8 package) or 7-pin (HRP7
package) EN/SYNC terminal and 6-pin RT terminal are shorted, the IC may also be damaged when VIN>7V.
5. Operation in strong electromagnetic field
Use caution when using the IC in the presence of a strong electromagnetic field as doing so may cause the IC to
malfunction.
6. Inspection with set printed circuit board
When testing the IC on an application board, connecting a capacitor to a pin with low impedance subjects the IC to stress.
Always discharge capacitors after each process or step. Always turn the IC’s power supply off before connecting it to, or
removing it from a jig or fixture, during the inspection process. Ground the IC during assembly steps as an antistatic
measure. Use similar precaution when transporting and storing the IC.
7. IC pin input (Fig. 26)
This monolithic IC contains P+ isolation and P substrate layers between adjacent elements to keep them isolated. P-N
junctions are formed at the intersection of these P layers with the N layers of other elements, creating a parasitic, creating
a parasitic diode or transistor. For example, the relation between each potential is as follows:
・When GND>pin A and GND>pin B, the P-N junction operates as a parasitic diode.
・When pin B >GND>pin A, the P-N junction operates as a parasitic transistor. Parasitic diodes can occur inevitably in
the structure of the IC. The operation of parasitic diodes can result in mutual interference among circuits, operational
faults, or physical damage. Accordingly, methods by which parasitic diodes operate, such as applying a voltage that is
lower than the GND (P substrate) voltage to an input pin, should not be used.
Resistor
Transistor (NPN)
(Terminal A)
(Terminal A)
(Terminal B)
Parasitic Element
(Terminal B)
P Substrate
Parasitic Element
Parasitic Element
P Substrate
Fig.29 Typical simple construction of monolithic IC
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15/17
Parasitic Element
2009.05 - Rev.A