ATF16V8B-25SC Ver la hoja de datos (PDF) - Atmel Corporation

Número de pieza

componentes Descripción

fabricante

ATF16V8B-25SC

High Performance Flash PLD

Atmel Corporation 

ATF16V8B

DC Characteristics

Symbol Parameter

Condition

Min Typ Max

Units

IIL

Input or I/O Low

Leakage Current

0 ≤ VIN ≤

VIL (MAX)

-35 -100

µA

IIH

Input or I/O High

Leakage Current

3.5 ≤ VIN ≤ VCC

10

µA

B-7, -10

Com.

Ind.

55

85

mA

55

95

mA

ICC

Power Supply Current,

Standby

VCC = MAX,

VIN = MAX,

Outputs Open

B-15, -25

BQ-10

Com.

Ind.

Com.

50

75

mA

50

80

mA

35

55

mA

ICC2

Clocked Power Supply VCC = MAX,

Current

Outputs Open

BQL-15, -25

BQL-15, -25

Com.

Ind.

Com.

Ind.

5

10

mA

5

15

mA

1

mA/MHz(2)

1

mA/MHz(2)

B-7, -10

ICC3

Clocked Power Supply

Current

VCC = MAX,

Outputs Open,

f = 15 MHz

B-15, -25

Com.

Ind.

Com.

Ind.

60

90

mA

60

100

mA

55

85

mA

55

95

mA

BQ-10

Com.

40

55

mA

BQL-15, -25

Com.

Ind.

20

35

mA

20

40

mA

IOS(1)

Output Short Circuit

Current

VOUT = 0.5V

-130

mA

VIL Input Low Voltage

-0.5

0.8

V

VIH Input High Voltage

2.0

VCC + 0.75 V

VOL

Output High Voltage

VIN = VIH or VIL, IOL = -24 mA

VCC = MIN

Com., Ind.

0.5

V

VOH

Output High Voltage

VIN = VIH or VIL,

VCC = MIN

IOH = -4.0 mA

2.4

V

Notes: 1. Not more than one output at a time should be shorted. Duration of short circuit test should not exceed 30 sec.

2. Low frequency only. See Supply Current versus Input Frequency curves.

1-9

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