NXP Semiconductors
10.2.1 Test circuits
74LV4053
Triple single-pole double-throw analog switch
5
(dB)
001aak361
VCC
VCC
VIH or VIL
S1 to S3 nY0 1
switch
2RL
nZ
nY1 2
0.1 µF
E
GND = VEE
GND
2RL CL dB
fi
001aak355
0
−5
10
102
103
104
105
106
f (kHz)
Fig 16. Test circuit for measuring frequency response
VCC = 3.0 V; GND = 0 V; VEE = −3.0 V; RL = 50 Ω;
RSOURCE = 1 kΩ.
Fig 17. Typical frequency response
0
(dB)
001aak360
VCC
VCC
VIH or VIL
VCC
0.1 µF
fi
S1 to S3
nZ
E
nY0 1
nY1 2
2RL
switch
GND = VEE
2RL
CL dB
001aak356
−50
−100
10
102
103
104
105
106
f (kHz)
Fig 18. Test circuit for measuring isolation (OFF-state)
VCC = 3.0 V; GND = 0 V; VEE = −3.0 V; RL = 50 Ω;
RSOURCE = 1 kΩ.
Fig 19. Typical isolation (OFF-state) as function of
frequency
74LV4053_4
Product data sheet
Rev. 04 — 10 August 2009
© NXP B.V. 2009. All rights reserved.
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