74AHC132D Ver la hoja de datos (PDF) - NXP Semiconductors.

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74AHC132D

Quad 2-input NAND Schmitt trigger

NXP Semiconductors. 

NXP Semiconductors

74AHC132; 74AHCT132

Quad 2-input NAND Schmitt trigger

VI 90 %

tW

negative

pulse

VM

GND

10 %

tf

tr

VI

90 %

positive

pulse

VM

10 %

GND

tW

VCC

VI

G

DUT

RT

VM

tr

tf

VM

VO

CL

001aah768

Fig 7.

Test data is given in Table 9.

Definitions test circuit:

RT = termination resistance should be equal to output impedance Zo of the pulse generator.

CL = load capacitance including jig and probe capacitance.

Load circuitry for measuring switching times

Table 9. Test data

Type

74AHC132

74AHCT132

Input

VI

VCC

3.0 V

tr, tf

≤ 3.0 ns

≤ 3.0 ns

Load

CL

50 pF, 15 pF

50 pF, 15 pF

Test

tPLH, tPHL

tPLH, tPHL

74AHC_AHCT132_6

Product data sheet

Rev. 06 — 4 May 2009

© NXP B.V. 2009. All rights reserved.

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