10-Bit, 7.5Msps, Ultra-Low-Power
Analog Front-End
Typical Operating Characteristics (continued)
(VDD = 3V, OVDD = 1.8V, internal reference (1.024V), CL ≈ 10pF on all digital outputs, fCLK = 7.5MHz (50% duty cycle), Rx ADC input
amplitude = -0.5dBFS, Tx DAC output amplitude = 0dBFS, differential Rx ADC input, differential Tx DAC output, CREFP = CREFN =
CCOM = 0.33µF, TA = +25°C, unless otherwise noted.)
Rx ADC SIGNAL-TO-NOISE AND DISTORTION
RATIO vs. SAMPLING RATE
57
fIN = 1.8063354MHz
56
IA
55
Rx ADC SPURIOUS-FREE DYNAMIC RANGE
vs. SAMPLING RATE
90
fIN = 1.8063354MHz
85
QA
80
Rx ADC SIGNAL-TO-NOISE RATIO
vs. CLOCK DUTY CYCLE
57
fIN = 1.8063354MHz
56
IA
55
54
75
53
QA
IA
54
QA
52
70
53
51
1.5 2.5 3.5 4.5 5.5 6.5 7.5
SAMPLING RATE (MHz)
Rx ADC SIGNAL-TO-NOISE AND DISTORTION
RATIO vs. CLOCK DUTY CYCLE
57
fIN = 1.8063354MHz
56
QA
55
54
IA
53
65
1.5 2.5 3.5 4.5 5.5 6.5 7.5
SAMPLING RATE (MHz)
Rx ADC SPURIOUS-FREE DYNAMIC RANGE
vs. CLOCK DUTY CYCLE
90
fIN = 1.8063354MHz
85
IA
80
75
QA
70
65
52
35
45
55
65
CLOCK DUTY CYCLE (%)
Rx ADC OFFSET ERROR
vs. TEMPERATURE
1.2
1.0
0.8
0.6
0.4
0.2
52
35
45
55
65
CLOCK DUTY CYCLE (%)
60
35
45
55
65
CLOCK DUTY CYCLE (%)
0
-40 -20 0
20 40 60 80
TEMPERATURE (°C)
Rx ADC GAIN ERROR
vs. TEMPERATURE
1.0
0.9
0.8
0.7
0.6
0.5
0.4
0.3
0.2
0.1
0
-40 -20 0 20 40 60 80
TEMPERATURE (°C)
Tx DAC SPURIOUS-FREE DYNAMIC
RANGE vs. SAMPLING RATE
80
fOUT = fCLK / 10
78
76
74
72
70
1.5 2.5 3.5 4.5 5.5 6.5 7.5
SAMPLING RATE (MHz)
Tx DAC SPURIOUS-FREE DYNAMIC
RANGE vs. OUTPUT FREQUENCY
80
78
76
74
72
0
0.5 1.0 1.5 2.0 2.5 3.0 3.5
OUTPUT FREQUENCY (MHz)
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