APL431
Reliability test program
Test item
SOLDERABILITY
HOLT
PCT
TST
ESD
Latch-Up
Method
MIL-STD-883D-2003
MIL-STD-883D-1005.7
JESD-22-B, A102
MIL-STD-883D-1011.9
MIL-STD-883D-3015.7
JESD 78
Description
245°C , 5 SEC
1000 Hrs Bias @ 125 °C
168 Hrs, 100 % RH , 121°C
-65°C ~ 150°C, 200 Cycles
VHBM > 2KV, VMM > 200V
10ms , Itr > 100mA
Carrier Tape & Reel Dimensions
t
Po
P
D
E
P1
F
Bo
W
Ko
Ao
D1
T2
J
C
A
B
T1
Application
A
330 ± 1
SOP- 8
F
B
62 +1.5
D
C
12.75+
0.15
D1
J
2 ± 0.5
Po
T1
12.4 ± 0.2
P1
T2
2 ± 0.2
Ao
Application
5.5± 1
A
178±1
1.55 +0.1 1.55+ 0.25 4.0 ± 0.1 2.0 ± 0.1
B
C
J
T1
60 ± 1.0 12.0 2.5 ± 0.15 9.0 ± 0.5
6.4 ± 0.1
T2
1.4
SOT-23
F
D
D1
Po
P1
Ao
3.5 ± 0.05 1.5 +0.1 F0.1MIN 4.0 2.0 ± 0.05 3.1
W
12± 0. 3
Bo
5.2± 0. 1
W
8.0+ 0.3
- 0.3
Bo
3.0
P
E
8± 0.1 1.75±0.1
Ko
t
2.1± 0.1 0.3±0.013
P
E
4.0
1.75
Ko
t
1.3
0.2±0.03
(mm)
Copyright ANPEC Electronics Corp.
14
Rev. C.1 - Jun., 2003
www.anpec.com.tw