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SCAN18541T Datasheet - Fairchild Semiconductor

SCAN18541T image

Part Name
SCAN18541T

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11 Pages

File Size
88.2 kB

MFG CO.
Fairchild
Fairchild Semiconductor 

General Description
The SCAN18541T is a high speed, low-power line driver featuring separate data inputs organized into dual 9-bit bytes with byte-oriented paired output enable control signals. This device is compliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK).


FEATUREs
■ IEEE 1149.1 (JTAG) Compliant
■ Dual output enable signals per byte
■ 3-STATE outputs for bus-oriented applications
■ 9-bit data busses for parity applications
■ Reduced-swing outputs source 32 mA/sink 64 mA
■ Guaranteed to drive 50Ω transmission line to TTL input levels of 0.8V and 2.0V
■ TTL compatible inputs
■ 25 mil pitch SSOP (Shrink Small Outline Package)
■ Includes CLAMP and HIGHZ instructions
■ Member of Fairchild’s SCAN Products

Page Link's: 1  2  3  4  5  6  7  8  9  10  More Pages 

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