HCPL-1930, HCPL-1931, HCPL-193K, 5962-89572
Dual Channel Line Receiver Hermetically
Sealed Optocoupler
Data Sheet
Description
The HCPL-193X devices are dual channel, hermeti-
cally sealed, high CMR, line receiver optocouplers. The
products are capable of operation and storage over the
full military temperature range and can be purchased as
either a standard product or with full MIL-PRF-38534 Class
Level H or K testing, or from the DLA Standard Microcircuit
Drawing (SMD) 5962-89572. This sixteen pin DIP may be
purchased with a variety of lead bend and plating options.
See selection guide table for details. Standard Microcircuit
Drawing (SMD) parts are available for each lead style.
Functional Diagram
Features
• Dual marked with device part number and DLA
standard microcircuit drawing
• Manufactured and tested on a MIL-PRF-38534 certified
line
• QML-38534, Class H and Class K
• Hermetically sealed 16-pin dual in-line package
• Performance guaranteed over full military temperature
range: -55° C to +125° C
• High speed – 10 Mb/s
• Accepts a broad range of drive conditions
• Adaptive line termination included
• Internal shield provides excellent common mode
rejection
• External base lead allows “LED Peaking” and LED
current adjustment
• 1500 Vdc withstand test voltage
• High radiation immunity
• HCPL-2602 function compatibility
• Reliability data available
Truth Table (Positive Logic)
INPUT
ON
OFF
ON
OFF
ENABLE
H
H
L
L
OUTPUT
L
H
H
H
Applications
• Military and space
• High reliability systems
• Isolated line receiver
• Simplex/multiplex data transmission
• Computer-peripheral interface
• Microprocessor system interface
• Harsh environmental environments
• Digital isolation for A/D, D/A conversion
• Current sensing
• Instrument input/output isolation
• Ground loop elimination
• Pulse transformer replacement
Note: The connection of a 0.1 µF bypass capacitor between pins 15 and 10 is recommended.
CAUTION: It is advised that normal static precautions be taken in handling and assembly
of this component to prevent damage and/or degradation which may be induced by ESD.