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HEF4030B View Datasheet(PDF) - NXP Semiconductors.

Part Name
Description
MFG CO.
HEF4030B
NXP
NXP Semiconductors. 
HEF4030B Datasheet PDF : 12 Pages
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NXP Semiconductors
11. Waveforms
HEF4030B
Quad 2-input EXCLUSIVE-OR gate
9,
Q$Q%LQSXW
 9 
WU

90
W3+/
92+
Q<RXWSXW
92/

90

W7+/
WI
W3/+
W7/+
DDD
Fig 4.
Measurement points are given in Table 9.
Logic levels: VOL and VOH are typical output voltage levels that occur with the output load.
Input to output propagation delays and output transition times
Table 9. Measurement points
Supply voltage
VDD
5 V to 15 V
Input
VM
0.5VDD
Output
VM
0.5VDD
VDD
VI
G
VO
DUT
RT
CL
001aag182
Fig 5.
Test data is given in Table 10.
Definitions for test circuit:
DUT = Device Under Test.
CL = load capacitance including jig and probe capacitance.
RT = termination resistance should be equal to the output impedance Zo of the pulse generator.
Test circuit for measuring switching times
Table 10. Test data
Supply voltage
VDD
5 V to 15 V
Input
VI
VSS or VDD
tr, tf
20 ns
Load
CL
50 pF
HEF4030B
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 4 — 13 November 2013
© NXP B.V. 2013. All rights reserved.
6 of 12

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