100329 View Datasheet(PDF) - Fairchild Semiconductor
Part Name
Description
MFG CO.
100329 Datasheet PDF : 11 Pages
| |||
Absolute Maximum Ratings(Note 4)
Storage Temperature (TSTG)
−65°C to +150°C
Maximum Junction Temperature (Tj) +150°C
VEE Pin Potential to Ground Pin
−7.0V to +0.5V
VTTL Pin Potential to Ground Pin
−0.5V to +6.0V
ECL Input Voltage (DC)
VEE to +0.5V
ECL Output Current
Recommended Operating
Conditions
Case Temperature (TC)
ECL Supply Voltage (VEE)
TTL Supply Voltage (VTTL)
0°C to +85°C
−5.7V to −4.2V
+4.5V to +5.5V
(DC Output HIGH)
−50 mA
TTL Input Voltage (Note 6)
−0.5V to +6.0V
TTL Input Current (Note 6)
−30 mA to +5.0 mA
Voltage Applied to Output
in HIGH State
3-STATE Output
Current Applied to TTL
Output in LOW State (Max)
ESD (Note 5)
−0.5V to +5.5V
twice the rated IOL (mA)
≥2000V
Note 4: The “Absolute Maximum Ratings” are those values beyond which
the safety of the device cannot be guaranteed. The device should not be
operated at these limits. The parametric values defined in the Electrical
Characteristics tables are not guaranteed at the absolute maximum rating.
The “Recommended Operating Conditions” table will define the conditions
for actual device operation.
Note 5: ESD testing conforms to MIL-STD-883, Method 3015.
Note 6: Either voltage limit or current limit is sufficient to protect inputs.
TTL-to-ECL DC Electrical Characteristics
VEE = −4.2V to −5.7V, VCC = VCCA = GND, TC = 0°C to +85°C, VTTL = +4.5V to +5.5V (Note 7)
Symbol
Parameter
Min
Typ
Max
Units
Conditions
VOH
Output HIGH Voltage
VOL
Output LOW Voltage
Cutoff Voltage
−1025
−1830
−955
−1705
−870
−1620
mV
VIN = VIH (Max) or VIL (Min)
mV Loading with 50Ω to −2V
OE or DIR LOW,
−2000
−1950
mV
VIN = VIH (Max) or VIL (Min)
Loading with 50Ω to −2V
VOHC
VOLC
Output HIGH Voltage
Corner Point HIGH
Output LOW Voltage
Corner Point LOW
−1035
−1610
mV
VIN = VIH (Min) or VIL (Max)
Loading with 50Ω to −2V
mV
VIH
VIL
IIH
IIL
VFCD
Input HIGH Voltage
Input LOW Voltage
Input HIGH Current
Breakdown Test
Input LOW Current
Input Clamp
Diode Voltage
2.0
0
−700
−1.2
5.0
V
Over VTTL, VEE, TC Range
0.8
V
Over VTTL, VEE, TC Range
70
µA
VIN = +2.7V
1.0
mA
VIN = +5.5V
µA
VIN = +0.5V
V
IIN = −18 mA
IEE
VEE Supply Current
LE LOW, OE and DIR HIGH
Inputs Open
−189
−94
mA
VEE = −4.2V to −4.8V
−199
−94
VEE = −4.2V to −5.7V
Note 7: The specified limits represent the “worst case” value for the parameter. Since these values normally occur at the temperature extremes, additional
noise immunity and guardbanding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are cho-
sen to guarantee operation under “worst case” conditions.
3
www.fairchildsemi.com
Share Link: 