74ABT374AD,112 View Datasheet(PDF) - NXP Semiconductors.
Part Name
Description
MFG CO.
74ABT374AD,112 Datasheet PDF : 16 Pages
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NXP Semiconductors
74ABT374A
Octal D-type flip-flop; positive-edge trigger; 3-state
VI
negative
pulse
0V
VI
positive
pulse
0V
90 %
10 %
VM
10 %
tf
tr
90 %
VM
tW
90 %
VM
10 %
tr
tf
90 %
VM
10 %
tW
001aai298
VI
G
VCC
VO
DUT
RT
a. Input pulse definition
b. Test circuit
Fig 9.
Test data is given in Table 8.
RL = Load resistance.
CL = Load capacitance including jig and probe capacitance.
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
VEXT = External voltage for measuring switching times.
Test circuit for measuring switching times
VEXT
RL
CL
RL
mna616
Table 8.
Input
VI
3.0 V
Test data
fi
1 MHz
tW
500 ns
tr, tf
2.5 ns
Load
CL
50 pF
RL
500
VEXT
tPHL, tPLH
open
tPZH, tPHZ
open
tPZL, tPLZ
7.0 V
74ABT374A
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 18 December 2012
© NXP B.V. 2012. All rights reserved.
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