NXP Semiconductors
HEF4538B
Dual precision monostable multivibrator
VDD
VI
G
VO
DUT
RT
CL
001aag182
Test data is given in Table 10.
Definitions for test circuit:
CL = load capacitance including jig and probe capacitance.
RT = termination resistance should be equal to the output impedance Zo of the pulse generator.
Fig 11. Test circuit
Table 10. Test data
Supply voltage
VDD
5 V to 15 V
Input
VI
VSS or VDD
tr, tf
20 ns
Load
CL
50 pF
HEF4538B
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 8 — 16 November 2011
© NXP B.V. 2011. All rights reserved.
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