ADC Transfer Function
The output coding of the ADT7411 analog inputs is straight
binary. The designed code transitions occur midway between
successive integer LSB values (i.e., 1/2 LSB, 3/2 LSB). The LSB is
VDD/1024 or Int VREF/1024, Int VREF = 2.25 V. The ideal transfer
characteristic is shown in Figure 24.
111...111
111...110
111...000
011...111
000...010
000...001
000...000
0V 1/2 LSB
1LSB = INT VREF/1024
1LSB = VDD/1024
+VREF – 1LSB
ANALOG INPUT
Figure 24. Transfer Function
To work out the voltage on any analog input channel, the
following method can be used:
1 LSB = Reference (V ) 1024
Convert the value read back from the AIN value register into
decimal.
AINVoltage = AINValue(d) × LSB size
where d = decimal
Example:
Internal reference used. Therefore, VREF = 2.25 V.
AIN value = 512d
1 LSB size = 2.25 V 1024 = 2.197 × 10−3
AINVoltage = 512 × 2.197 × 10−3
= 1.125V
Analog Input ESD Protection
Figure 26 shows the input structure that provides ESD protec-
tion on any of the analog input pins. The diode provides the
main ESD protection for the analog inputs. Care must be taken
that the analog input signal never drops below the GND rail by
more than 200 mV. If this happens, the diode will become
forward biased and start conducting current into the substrate.
The 4 pF capacitor is the typical pin capacitance and the resistor
is a lumped component made up of the on resistance of the
multiplexer switch.
VDD
I
N×I
IBIAS
ADT7411
INTERNAL
SENSE
TRANSISTOR
BIAS
DIODE
VOUT+
TO ADC
VOUT–
Figure 25. Top Level Structure of Internal Temperature Sensor
AIN
4pF
100Ω
Figure 26. Equivalent Analog Input ESD Circuit
AIN Interrupts
The measured results from the AIN inputs are compared with
the AIN VHIGH (greater than comparison) and VLOW (less than or
equal to comparison) limits. An interrupt occurs if the AIN
inputs exceed or equal the limit registers. These voltage limits
are stored in on-chip registers. Note that the limit registers are
eight bits long while the AIN conversion result is 10 bits long.
If the voltage limits are not masked out, any out-of-limit
comparisons generate flags that are stored in the Interrupt
Status 1 register (Address 00h) and one or more out-of-limit
results will cause the INT/INT output to pull either high or low,
depending on the output polarity setting. It is good design prac-
tice to mask out interrupts for channels that are of no concern
to the application. Figure 27 shows the interrupt structure for
the ADT7411. It shows a block diagram representation of how
the various measurement channels affect the INT/INT pin.
FUNCTIONAL DESCRIPTION—MEASUREMENT
Temperature Sensor
The ADT7411 contains an A/D converter with special input
signal conditioning to enable operation with external and on-
chip diode temperature sensors. When the ADT7411 is oper-
ating in single-channel mode, the A/D converter continually
processes the measurement taken on one channel only. This
channel is preselected by bits C0:C3 in the Control Config-
uration 2 register (Address 19h). When in round robin mode
the analog input multiplexer sequentially selects the VDD input
channel, on-chip temperature sensor to measure its internal
temperature, the external temperature sensor, or an AIN
channel, and then the rest of the AIN channels. These signals
are digitized by the ADC and the results stored in the various
value registers.
Rev. A | Page 15 of 36