MSK604 View Datasheet(PDF) - M.S. Kennedy Corporation
Part Name
Description
MFG CO.
MSK604 Datasheet PDF : 4 Pages
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ABSOLUTE MAXIMUM RATINGS
±VHV
±VIN
±VCC
θJC
Supply Voltage ○ ○ ○ ○ ○ ○ ○ ○ ○ +○ 20,-120VDC TST
Input Voltage Range
○
○
○
○
○
○
○
○
○
○
○ ±VCC
TLD
Supply Voltage (Input Stage)○ ○ ○ ○ ○ ±18VDC
Thermal Resistance ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ 18°C/W TC
(Output Devices)
TJ
Storage Temperature Range -65°C to +150°C
Lead Temperature Range○ ○ ○ ○ ○ ○ ○ ○ ○ ○ 300°C
(10 Seconds)
Case Operating Temperature
MSK604 ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ -40°C to +85°C
MSK604B ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ -55°C to +125°C
Junction Temperature ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ 150°C
ELECTRICAL SPECIFICATIONS
Parameter
STATIC
Quiescent Current
Input Offset Voltage
Input Bias Current
Input Offset Voltage Drift 2
Power Supply Range
DYNAMIC CHARACTERISTICS
Output Voltage Swing 2
Peak Output Current
2
Full Power Output
2
Unity Gain Bandwidth
Slew Rate 2
Voltage Gain 2
Settling Time to 1% 2
Settling Time to 0.1%
Test Conditions
VIN=0 @ +VCC
VIN=0 @ -VCC
VIN=0 @ +VHV
VIN=0 @ -VHV
VIN=0
VIN=0
±VCC
+VHV
-VHV
f=1KHz
f=1KHz
VO=70V
VO=1.0V
VO=80V
f=1KHz
AV=-10V/V VO=50V
AV=-10V/V VO=50V
Group A
MSK 604B 4
Subgroup Min. Typ. Max.
MSK 604 3
Min. Typ. Max.
Units
1,2,3
1,2,3
1
2,3
1
2,3
1
2,3
1
2,3
2,3
-
-
-
-
-
-
-
-
-
-
-
-
-
-
±12
0
-50
1.5 2.0
15 25
10 15
14 17
10 15
14 17
±1.0 ±5.0
±2.0 ±10.0
50 250
100 350
±10 ±50
±15 ±18
+15 +20
-100 -120
-
-
-
-
-
-
-
-
-
-
-
±12
0
-50
1.8 2.5
20 30
10 20
-
-
10 20
-
-
±1.0 ±10
±2.0 -
50 500
100 -
±10 -
±15 ±18
+15 +20
-100 -120
mA
mA
mA
mA
mA
mA
mV
mV
nA
nA
µV/°C
V
V
V
4
-90/+5 -95/8 - -90/+5 -95/8 -
V
-
±100 ±250 - ±100 ±250 -
mA
-
1
2
-
1
2
-
MHz
-
50 100
-
50 100 -
MHz
4
2000 3000 -
2000 3000 -
V/µS
-
94 100
-
90 100 -
dB
-
-
200
-
- 200 -
nS
-
- 1000 -
- 1000 -
nS
NOTES:
1 Unless otherwise specified, ±VCC=±15VDC, +VHV=+15VDC, -VHV=-100V CL=8pF (probe capacitance) and AV=-10V/V.
2 This parameter is guaranteed by design but not tested. Typical parameters are representative of actual device performance but are for reference only.
3 Industrial grade devices shall be tested to subgroups 1 and 4 unless otherwise specified.
4 Military grade devices ('B' suffix) shall be 100% tested to subgroups 1,2,3 and 4.
5 Subgroup 1,4 TA=TC=+25°C
Subgroup 2,5 TA=TC=+125°C
Subgroup 3,6 TA=TC=-55°C
2
Rev. B 8/00
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