IDT82V3002A View Datasheet(PDF) - Integrated Device Technology

Part Name

Description

MFG CO.

IDT82V3002A

WAN PLL WITH DUAL REFERENCE INPUTS

Integrated Device Technology 

IDT82V3002A WAN PLL WITH DUAL REFERENCE INPUTS

INDUSTRIAL TEMPERATURE RANGE

Table - 1 Pin Description (Continued)

Name

Type

Pin

Number

Description

TCK

I

28

Test Clock.

Provides a clock to JTAG test logic.

TMS

I

31

Test Mode Select.

JTAG signal that controls the state transitions of the TAP controller. This pin is internally pulled up to VDD.

IC0, IC1, IC2

-

53, 54, 55

Internal Connection.

Internal Use. These pins should be connected to VSS when in normal operation.

IC

-

8, 21, 22, Internal Connection.

34, 35, 43 Internal Use. These pins should be left open when in normal operation.

9

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