ICS8344
LOW SKEW, 1-TO-24
DIFFERENTIAL-TO-LVCMOS FANOUT BUFFER
ABSOLUTE MAXIMUM RATINGS
Supply Voltage, VDDx
Inputs, VI
Outputs, VO
Package Thermal Impedance, θJA
Storage Temperature, T
STG
4.6V
-0.5V to VDD + 0.5V
-0.5V to VDDO + 0.5V
47.9°C/W (0 lfpm)
-65°C to 150°C
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These ratings
are stress specifications only. Functional operation of product at these conditions or any conditions beyond those listed in
the DC Characteristics or AC Characteristics is not implied. Exposure to absolute maximum rating conditions for extended
periods may affect product reliability.
TABLE 4A. POWER SUPPLY DC CHARACTERISTICS, VDD = VDDO = 3.3V±5%, TA = 0°C TO 70°C
Symbol Parameter
Test Conditions
Minimum
VDD
VDDO
IDD
Positive Supply Voltage
Output Supply Voltage
Positive Supply Current
3.135
3.135
Typical
3.3
3.3
Maximum
3.465
3.465
120
Units
V
V
mA
TABLE 4B. LVCMOS DC CHARACTERISTICS, VDD = VDDO = 3.3V±5%, TA = 0°C TO 70°C
Symbol
VIH
VIL
IIH
I
IL
Parameter
Input High Voltage
Input Low Voltage
Input High Current
Input Low Current
CLK_SEL,
OE1, OE2, OE3
CLK_SEL,
OE1, OE2, OE3
OE1, OE2, OE3
CLK_SEL
OE1, OE2, OE3
CLK_SEL
VOH
Output High Voltage
VOL
Output Low Voltage
Test Conditions
Minimum
2
VDD = VIN = 3.465V
VDD = VIN = 3.465V
VDD = 3.465, VIN = 0V
VDD = 3.465, VIN = 0
VDD = VDDO = 3.135V
IOH = -36mA
VDD = VDDO = 3.135V
IOL = 36mA
-0.3
-150
-5
2.6
Typical
Maximum
VDD + 0.3
0.8
5
150
0.6
Units
V
V
µA
µA
µA
µA
V
V
TABLE 4C. DIFFERENTIAL DC CHARACTERISTICS, VDD = VDDO = 3.3V±5%, TA = 0°C TO 70°C
Symbol Parameter
Test Conditions
Minimum Typical
nCLK0, nCLK1
IIH
Input High Current
CLK0, CLK1
nCLK0, nCLK1
IIL
Input Low Current
CLK0, CLK1
-150
-5
VPP
Peak-to-Peak Input Voltage
0.15
VCMR
Common Mode Input Voltage; Note 1, 2
GND + 0.5
NOTE 1: Common mode voltage is defined as VIH.
NOTE 2: For single ended applications, the maximum input voltage for CLKx, nCLKx is V + 0.3V.
DD
Maximum
5
150
1.3
VDD - 0.85
Units
µA
µA
µA
µA
V
V
8344BY
4
REV. A JANUARY 5, 2011