5962-04205 View Datasheet(PDF) - HP => Agilent Technologies

Part Name

Description

MFG CO.

5962-04205

0.5 Amp Output Current IGBT Gate Drive Optocoupler

HP => Agilent Technologies 

Package Characteristics

Over recommended operating conditions (TA = -55 to +125°C) unless otherwise specified.

Parameter

Input-Output

Leakage Current

Symbol

II-O

Resistance

RI-O

(Input-Output)

Capacitance

CI-O

(Input-Output)

*All typicals at TA = 25°C.

Test Conditions

VI-O = 1500Vdc

RH = 45%,

t = 5 sec.,

TA = 25°C

VI-O = 500 VDC

Group A

Limits

Subgroups

Units Fig. Note

(13)

Min. Typ.* Max.

1.0 µA

5, 6

1

1010

Ω

6

f = 1 MHz

2.34

pF

6

Notes:

1. Maximum pulse width = 10 µs, maximum duty cycle = 0.2%. This value is intended to allow for component tolerances for designs with IO peak minimum

= 0.5 A. See Applications section for additional details on limiting IOH peak.

2. Maximum pulse width = 50 µs, maximum duty cycle = 0.5%.

3. In this test VOH is measured with a dc load current. When driving capacitive loads VOH will approach VCC as IOH approaches zero amps.

4. Maximum pulse width = 1 ms, maximum duty cycle = 20%.

5. This is a momentary withstand test, not an operating condition.

6. Device considered a two-terminal device: pins on input side shorted together and pins on output side shorted together.

7. The difference between tPHL and tPLH between any two HCPL-5150 parts under the same test condition.

8. Pins 1 and 4 need to be connected to LED common.

9. Common mode transient immunity in the high state is the maximum tolerable |dVCM/dt| of the common mode pulse, VCM, to assure that the output will

remain in the high state (i.e., VO > 15.0 V).

10. Common mode transient immunity in a low state is the maximum tolerable |dVCM/dt| of the common mode pulse, VCM, to assure that the output will

remain in a low state (i.e., VO < 1.0 V).

11. This load condition approximates the gate load of a 1200 V/25 A IGBT.

12. Pulse Width Distortion (PWD) is defined as |tPHL-tPLH| for any given device.

13. Standard parts receive 100% testing at 25°C (Subgroups 1 and 9). SMD and Class H parts receive 100% testing at 25, 125 and -55°C (Subgroups 1 and 9,

2 and 10, 3 and 11, respectively).

14. Parameters are tested as part of device initial characterization and after design and process changes. Parameters are guaranteed to limits specified for

all lots not specifically tested.

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