28F020
DC CHARACTERISTICS TTL NMOS COMPATIBLE Extended Temperature
Products
Symbol
Parameter
Limits
Notes
Min Typ(3) Max
Unit
Test Conditions
ILI
Input Leakage Current
1
ILO
Output Leakage Current
1
ICCS VCC Standby Current
1
ICC1 VCC Active Read Current
1
ICC2 VCC Programming Current
12
ICC3 VCC Erase Current
12
ICC4 VCC Program Verify Current
12
g1 0
mA VCC e VCC Max
VIN e VCC or VSS
g10
mA VCC e VCC Max
VOUT e VCC or VSS
03
10
mA VCC e VCC Max
CE e VIH
10
30
mA VCC e VCC Max CE e VIL
f e 6 MHz IOUT e 0 mA
10
30 mA Programming in Progress
50
30 mA Erasure in Progress
50
30
mA VPP e VPPH
Program Verify in Progress
ICC5 VCC Erase Verify Current
12
50
30
mA VPP e VPPH
Erase Verify in Progress
IPPS VPP Leakage Current
1
IPP1 VPP Read Current ID Current 1
or Standby Current
IPP2 VPP Programming Current
12
g10 mA VPP s VCC
90
200 mA VPP l VCC
g10
VPP s VCC
8
30
mA VPP e VPPH
Programming in Progress
IPP3 VPP Erase Current
12
IPP4 VPP Program Verify Current
12
10
30
mA VPP e VPPH
20
50
mA VPP e VPPH
Program Verify in Progress
IPP5 VPP Erase Verify Current
12
20
50
mA VPP e VPPH
Erase Verify in Progress
VIL
Input Low Voltage
VIH
Input High Voltage
VOL Output Low Voltage
VOH1 Output High Voltage
VID
A9 Intelligent Identifer
Voltage
b0 5
20
24
11 50
08
V
VCC a 0 5 V
0 45
V IOL e 5 8 mA
VCC e VCC Min
V IOH e b2 5 mA
VCC e VCC Min
13 00 V
IID
A9 Intelligent Identifier
12
90
500 mA A9 e VID
Current
VPPL
VPPH
VPP during Read-Only
Operations
VPP during Read Write
Operations
0 00
11 40
65
12 60
V NOTE Erase Program are
Inhibited when VPP e VPPL
V
VLKO VCC Erase Write Lock Voltage
25
V
17