74AHC1G125
SINGLE BUFFER GATE WITH 3-STATE OUTPUT
Parameter Measurement Information
Under Test
CL
(see Note A)
RL=1 kΩ S1
Vcc
Open
GND
TEST
tPLH/tPHL
tPLZ/tPZL
tPHZ/tPZH
S1
Open
Vload
GND
VCC
3.3V±0.3V
5V±0.5V
3.3V±0.3V
5V±0.5V
Inputs
VI
tr/tf
VCC
≤3ns
VCC
≤3ns
VCC
≤3ns
VCC
≤3ns
VM
VCC/2
VCC/2
VCC/2
VCC/2
CL
15pF
15pF
50pF
50pF
V∆
0.3V
0.3V
0.3V
0.3V
Voltage Waveform Pulse Duration
Voltage Waveform Enable and Disable Times
Low and High Level Enabling
Voltage Waveform Propagation Delay Times
Inverting and Non Inverting Outputs
Figure 1. Load Circuit and Voltage Waveforms
Notes:
A. Includes test lead and test apparatus capacitance.
B. All pulses are supplied at pulse repetition rate ≤ 1 MHz.
C. Inputs are measured separately one transition per measurement.
D. tPLZ and tPHZ are the same as tdis.
E. tPZL and tPZH are the same as tEN.
F. tPLH and tPHL are the same as tPD.
74AHC1G125
Document number: DS35176 Rev. 1 - 2
6 of 9
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March 2011
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