LH28F008SCHN-V85 View Datasheet(PDF) - Sharp Electronics
Part Name
Description
MFG CO.
LH28F008SCHN-V85 Datasheet PDF : 40 Pages
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LH28F008SC-V/SCH-V
6.2.4 AC CHARACTERISTICS - READ-ONLY OPERATIONS (NOTE 1)
• VCC = 5.0±0.25 V, 5.0±0.5 V, TA = 0 to +70˚C or –25 to +85˚C
VERSIONS
(NOTE 4)
VCC±0.25 V LH28F008SC-V85/
LH28F008SCH-V85
VCC±0.5 V
(NOTE 5)
(NOTE 5)
UNIT
LH28F008SC-V85/ LH28F008SC-V12/
LH28F008SCH-V85 LH28F008SCH-V12
SYMBOL
PARAMETER
NOTE MIN.
tAVAV Read Cycle Time
85
tAVQV Address to Output Delay
tELQV CE# to Output Delay
2
tPHQV RP# High to Output Delay
tGLQV OE# to Output Delay
2
tELQX CE# to Output in Low Z
3
0
tEHQZ CE# High to Output in High Z
3
tGLQX OE# to Output in Low Z
3
0
tGHQZ OE# High to Output in High Z
3
Output Hold from Address,
tOH
CE# or OE# Change,
3
0
Whichever Occurs First
NOTES :
1. See AC Input/Output Reference Waveform (Fig. 9 and
Fig. 10) for maximum allowable input slew rate.
2. OE# may be delayed up to tELQV-tGLQV after the falling
edge of CE# without impact on tELQV.
3. Sampled, not 100% tested.
4. See Fig. 9 "Transient Input/Output Reference
Waveform" and Fig. 11 "Transient Equivalent Testing
Load Circuit" (High Speed Configuration) for testing
characteristics.
MAX.
85
85
400
40
55
10
MIN.
90
0
0
MAX.
90
90
400
45
55
10
MIN.
120
0
0
MAX.
ns
120 ns
120 ns
400 ns
50 ns
ns
55 ns
ns
15 ns
0
0
ns
5. See Fig. 10 "Transient Input/Output Reference
Waveform" and Fig. 11 "Transient Equivalent Testing
Load Circuit" (Standard Configuration) for testing
characteristics.
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