FSTU32160(2000) View Datasheet(PDF) - Fairchild Semiconductor
Part Name
Description
MFG CO.
FSTU32160
(Rev.:2000)
(Rev.:2000)
Fairchild Semiconductor
FSTU32160 Datasheet PDF : 6 Pages
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AC Electrical Characteristics
TA = −40 °C to +85 °C,
Symbol
Parameter
CL = 50 pF, RU= RD = 500Ω
VCC = 4.5 − 5.5V
VCC = 4.0V
Units Conditions
Figure No.
Min
Max
Min
Max
tPHL, tPLH
A or B, to B or A (Note 7)
0.25
0.25
ns VI = OPEN
Figure 2
Figure 3
tPZH
Output Enable Time,
SEL to A, B
7.0
30.0
35.0
ns
VI = OPEN for tPZH
BiasV = GND
Figure 2
Figure 3
tPZL
Output Enable Time,
SEL to A, B
7.0
30.0
35.0
ns
VI = 7V for tPZL
BiasV = 3V
Figure 2
Figure 3
tPHZ
Output Disable Time,
SEL to A, B
1.0
6.9
7.3
ns
VI = OPEN for tPHZ
BiasV = GND
Figure 2
Figure 3
tPLZ
Output Disable Time,
SEL to A, B
1.0
7.7
7.7
ns
VI = 7V for tPLZ,
BiasV = 3V
Figure 2
Figure 3
Note 7: This parameter is guaranteed by design but is not tested. The bus switch contributes no propagation delay other than the RC delay of the typical On
resistance of the switch and the 50pF load capacitance, when driven by an ideal voltage source (zero output impedance).
Capacitance (Note 8)
Symbol
Parameter
Typ
CIN
Control pin Input Capacitance
4
CI/O OFF
Input/Output Capacitance “OFF State”
8
Note 8: TA = +25°C, f = 1 MHz, Capacitance is characterized but not tested.
Undershoot Characteristic (Note 9)
Max
Units
pF
pF
Conditions
VCC = 5.0V
VCC = 5.0V, Switch OFF
Symbol
Parameter
Min
Typ
Max
Units
Conditions
VOUTU
Output Voltage During Undershoot
2.5
VOH − 0.3
V
Figure 1
Note 9: This test is intended to characterize the device’s protective capabilities by maintaining output signal integrity during an input transient voltage
undershoot event.
FIGURE 1.
Device Test Conditions
Parameter
VIN
R1 = R2
VTRI
VCC
Value
see Waveform
100K
11.0
5.5
Units
V
Ω
V
V
Transient
Input Voltage (VIN) Waveform
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