NXP Semiconductors
HEF4051B
8-channel analog multiplexer/demultiplexer
VDD
VDD or VSS
VSS
S1 to S3
Z
E
fi
Y0 1
Yn 2
switch
VSS = VEE
RL
CL dB
Fig 19. Test circuit for measuring isolation (OFF-state)
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a. Test circuit
0.5VDD
VDD
RL
S1 to S3
Z
E
G
VDD or VSS
Y0 1
Yn 2
switch
VSS = VEE
RL
CL V VO
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logic
off
on
off
input (Sn, E)
VO
Vct
001aaj908
b. Input and output pulse definitions
Fig 20. Test circuit for measuring crosstalk voltage between digital inputs and switch
HEF4051B
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 10 — 17 November 2011
© NXP B.V. 2011. All rights reserved.
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