MT8940 ISO-CMOS
AC Electrical Characteristics† - Uncommitted NAND Gate
Voltages are with respect to ground (VSS) unless otherwise stated.
Characteristics
Sym Min Typ‡ Max
Units
Test Conditions
1 Propagation delay (LOW to
HIGH), input Ai or Bi to output
tPLH
25
40
ns Test load circuit 1 (Fig. 17)
2 Propagation delay (HIGH to
LOW), input Ai or Bi to output
tPHL
20
40
ns Test load circuit 1 (Fig. 17)
† Timing is over recommended temperature & power supply voltages.
‡ Typical figures are at 25°C and are for design aid only: not guaranteed and not subject to production testing.
From
output
under test
CL=50pF
Test
point
Test load circuit- 1
From
output
under test
VDD
RL=1kΩ
Test
point
CL=50pF
Test load circuit- 2
VDD
From
output
under test
Test
point
RL=1kΩ
A
S1 B
VSS
CL=50pF
Test load circuit- 3
Note: S1 is in position A
when measuring tPLZ
and tPZ and in position B
when measuring tPHZ and
tPZH
Figure 17 - Test Load Circuits
3-42