IDT7026L(1996) View Datasheet(PDF) - Integrated Device Technology

Part Name

Description

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IDT7026L
(Rev.:1996)

HIGH-SPEED 16K x 16 DUAL-PORT STATIC RAM

Integrated Device Technology 

IDT7026S/L

HIGH-SPEED 16K x 16 DUAL-PORT STATIC RAM

MILITARY AND COMMERCIAL TEMPERATURE RANGES

AC TEST CONDITIONS

Input Pulse Levels

Input Rise/Fall Times

Input Timing Reference Levels

Output Reference Levels

Output Load

GND to 3.0V

5ns Max.

1.5V

1.5V

Figures 1 and 2

2939 tbl 11

DATAOUT

BUSY

INT

347Ω

5V

893Ω

30pF

DATAOUT

347Ω

5V

893Ω

5pF

2939 drw 04

Figure 1. AC Output Load

2939 drw 05

Figure 2. Output Test Load

(for tLZ, tHZ, tWZ, tOW)

* Including scope and jig.

AC ELECTRICAL CHARACTERISTICS OVER THE

OPERATING TEMPERATURE AND SUPPLY VOLTAGE RANGE(4)

Symbol

Parameter

IDT7026X20

Com'l. Only

Min. Max.

IDT7026X25

Min. Max. Unit

READ CYCLE

tRC

Read Cycle Time

tAA

Address Access Time

tACE

Chip Enable Access Time(3)

tABE

Byte Enable Access Time(3)

tAOE

Output Enable Access Time

tOH

Output Hold from Address Change

tLZ

Output Low-Z Time(1, 2)

tHZ

Output High-Z Time(1, 2)

tPU

Chip Enable to Power Up Time(2)

tPD

Chip Disable to Power Down Time(2)

tSOP

Semaphore Flag Update Pulse (OE or SEM)

tSAA

Semaphore Address Access Time

20

—

25

— ns

—

20

—

25 ns

—

20

—

25 ns

—

20

—

25 ns

—

12

—

13 ns

3

—

3

— ns

3

—

3

— ns

—

12

—

15 ns

0

—

0

— ns

—

20

—

25 ns

10

—

12

— ns

—

20

—

25 ns

IDT7026X35 IDT7026X55

Symbol

Parameter

Min.

READ CYCLE

tRC

Read Cycle Time

35

tAA

Address Access Time

—

tACE

Chip Enable Access Time(3)

—

tABE

Byte Enable Access Time(3)

—

tAOE

Output Enable Access Time

—

tOH

Output Hold from Address Change

3

tLZ

Output Low-Z Time(1, 2)

3

tHZ

Output High-Z Time(1, 2)

—

tPU

Chip Enable to Power Up Time(2)

0

tPD

Chip Disable to Power Down Time(2)

—

tSOP

Semaphore Flag Update Pulse (OE or SEM)

15

tSAA

Semaphore Address Access Time

—

NOTES:

1. Transition is measured ±200mV from Low or High-impedance voltage with Output Test Load (Figure 2).

2. This parameter is guaranteed by device characterization, but is not production tested.

3. To access RAM, CE = VIL and SEM = VIH. To access semaphore, CE = VIH and SEM = VIL.

4. "X" in part numbers indicates power rating (S or L).

Max.

—

35

35

35

20

—

—

15

—

35

—

35

Min.

55

—

—

—

—

3

3

—

0

—

15

—

Max. Unit

— ns

55 ns

55 ns

55 ns

30 ns

— ns

— ns

25 ns

— ns

50 ns

— ns

55 ns

2939 tbl 12

6.17

7

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