74F194 View Datasheet(PDF) - NXP Semiconductors.
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74F194 Datasheet PDF : 10 Pages
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Philips Semiconductors
4-bit bidirectional universal shift register
Product specification
74F194
DC ELECTRICAL CHARACTERISTICS
SYMBOL
PARAMETER
TEST CONDITIONS1
LIMITS
MIN TYP2 MAX
UNIT
VOH
High-level output voltage3
VCC = MIN, VIL = MAX ±10%VCC
2.5
V
VIH = MIN, IOH = MAX ±5%VCC
2.7
3.4
VOL
Low-level output voltage
VCC = MIN, VIL = MAX ±10%VCC
VIH = MIN, IOL = MAX ±5%VCC
0.30 0.50
V
0.30 0.50
VIK
Input clamp voltage
VCC = MIN, II = IIK
–0.73 –1.2
V
II
Input current at maximum input voltage
VCC = MAX, VI = 7.0V
100
µA
IIH
High-level input current
VCC = MAX, VI = 2.7V
20
µA
IIL
Low-level input current
VCC = MAX, VI = 0.5V
–0.6
mA
IOS
Short-circuit output current4
VCC = MAX
–60
–150
mA
ICC
Supply current (total)5
VCC = MAX
33
46
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Output High state will change to Low stat if an external voltage of less than 0.0V is applied.
4. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
5. With all outputs open, Di inputs grounded and a 4.5V applied to S0, S1, MR and the serial inputs, ICC is tested with a momentary ground,
then 4.5V applied to CP.
AC ELECTRICAL CHARACTERISTICS
SYMBOL
PARAMETER
fMAX
tPLH
tPHL
tPHL
Maximum clock frequency
Propagation delay
CP to Qn
Propagation delay
MR to Qn
TEST
CONDITION
Waveform 1
Waveform 1
Waveform 2
LIMITS
VCC = +5.0V
Tamb = +25°C
CL = 50pF, RL = 500Ω
VCC = +5.0V ± 10%
Tamb = 0°C to +70°C
CL = 50pF, RL = 500Ω
MIN TYP MAX
MIN
MAX
105 150
90
3.5
5.2
7.0
3.5
8.0
3.5
5.5
7.0
3.5
8.0
4.5
8.6 12.0
4.5
14.0
UNIT
MHz
ns
ns
AC SETUP REQUIREMENTS
SYMBOL
PARAMETER
tS(H)
tS(L)
th(H)
th(L)
tS(H)
tS(L)
th(H)
th(L)
tW(H)
tW(L)
tREC
Setup time, High or Low
Dn, DSL, DSR to CP
Hold time, High or Low
Dn, DSL, DSR to CP
Setup time, High or Low
Sn to CP
Hold time, High or Low
Sn to CP
CP Pulse width, High
MR Pulse width, Low
Recovery time, MR to CP
TEST
CONDITION
Waveform 3
Waveform 3
Waveform 3
Waveform 3
Waveform 1
Waveform 2
Waveform 2
LIMITS
VCC = +5.0V
Tamb = +25°C
CL = 50pF, RL = 500Ω
VCC = +5.0V ± 10%
Tamb = 0°C to +70°C
CL = 50pF, RL = 500Ω
MIN TYP MAX
MIN
MAX
4.0
4.0
4.0
4.0
0
1.0
0
1.0
8.0
9.0
8.0
8.0
0
0
0
0
5.0
5.5
5.0
5.0
7.0
8.0
UNIT
ns
ns
ns
ns
ns
ns
ns
April 4, 1989
5
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