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MSK645 View Datasheet(PDF) - M.S. Kennedy Corporation

Part Name
Description
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MSK645 Datasheet PDF : 6 Pages
1 2 3 4 5 6
ABSOLUTE MAXIMUM RATINGS 7
+VHV
High Voltage Supply
+80V
+V Input Voltage ±5V IN
+VBIAS Bias Input Voltage
+10V
IOUT
Peak Output Current
200mA
TST Storage Temperature Range -65°C to +150°C
TLD
Lead Temperature Range
+300°C
(Solder 10 Seconds)
TJ Junction Temperature ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ +175°C
TC Case Operating Temperature
MSK645
-40°C to +85°C
MSK645(B) ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ -55°C to +125°C
ELECTRICAL SPECIFICATIONS
Parameter
STATIC CHARACTERISTICS
Quiescent Current (VHV)
Quiescent Current (+VBIAS)
VHV Power Supply Range
VBIAS Power Supply Range
Video Input Voltage
Thermal Resistance 2
DYNAMIC CHARACTERISTICS
Video Output Voltage 6
Video Gain
Video Gain Flatness 2
Video Output Rise/Fall Time
Video Output Overshoot 2
Bandwidth -3dB 2
Test Conditions 1
Group A
MSK 645(B)
MSK 645
Units
Subgroup Min. Typ. Max. Min. Typ. Max.
VIN=No Connect RL=
VIN=No Connect RL=
VOUT=+50VDC
Output Stage
Junction to Case @ 125°C
1,2,3
1,2,3
-
-
1,2,3
-
-
0.6 2.0
- 0.01 0.5
20 60 80
4
5 10
0.5 0.85 1.2
- 0.6 2.0 mA
- 0.01 0.5 mA
20 60 80 V
4
5
10 V
0.4 0.85 1.3 V
-
26 30
- 26 32 °C/W
High Level
4
Low Level
4
F=1MHz;VOUT=+15Vto+45V
4
F=10Hz to 60MHz;VOUT=30VPP
-
VOUT=+15Vto+45V
4
VOUT=10VPP VINTR=10nS
-
4
50 59
-
50 59
-
V
-
5 10
-
5 10 V
45 62 80 45 60 80 V/V
- ±1.0 ±2.0 - ±1.0 ±3.0 dB
-
3.0 4.0
- 3.0 5.0 nS
-
-
10
-
-
12 %
100 150 - 100 150 - MHz
NOTES:
1 +VHV=60V; +VBIAS=5V; RL=10K; unless otherwise specified.
2 Parameter is guaranteed by design but not tested. Typical specifications are representative of actual device
performance at 25°C but are for reference only.
3 Military grade devices ('B' suffix) shall be 100% tested to subgroups 1,2,3 and 4.
4 Subgroup 5 and 6 testing available upon request.
5 Subgroup 1,4 TA=TC=+25°C
Subgroup 2,5 TA=TC=+125°C
Subgroup 3,6 TA=TC=-55°C
6 Refer to the video clip point curve on the Typical Performance Curves page.
7 Continuous operation at or above absolute maximum ratings may adversely effect the device performance
and/or life cycle.
2
Rev. D 10/05

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