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TC58NVG0S3AFT05 View Datasheet(PDF) - Toshiba

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TC58NVG0S3AFT05 Datasheet PDF : 33 Pages
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TC58NVG0S3AFT05
(14) Failure phenomena for Program and Erase operations
The device may fail during a Program or Erase operation.
The following possible failure modes should be considered when implementing a highly reliable system.
FAILURE MODE
Block
Erase Failure
Page
Programming Failure
Programming Failure
Single Bit
“1 to 0”
DETECTION AND COUNTERMEASURE SEQUENIE
Status Read after Erase Block Replacement
Status Read after Program Block Replacement
(1) Block Verify after Program Retry
(2) ECC
ECC: Error Correction Code.
Block Replacement
Program
Error occurs
Buffer
memory
Block A
Block B
When an error happens in Block A, try to
reprogram the data into another Block (Block
B) by loading from an external buffer. Then,
prevent further system accesses to Block A (by
creating a bad block table or by using another
appropriate scheme).
Figure 28.
Erase
When an error occurs in an Erase operation, prevent future accesses to this bad block
(again by creating a table within the system or by using another appropriate scheme).
(15) Do not turn off the power before write/erase operation is complete. Avoid using the device when the battery
is low. Power shortage and/or power failure before write/erase operation is complete will cause loss of data
and/or damage to data.
2003-08-20A 31/33

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