TC58NVG1S3BFT00 View Datasheet(PDF) - Toshiba

Part Name

Description

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TC58NVG1S3BFT00

TOSHIBA MOS DIGITAL INTEGRATED CIRCUIT SILICON GATE CMOS

Toshiba 

TC58NVG1S3BFT00/TC58NVG1S8BFT00

Status Read

The device automatically implements the execution and verification of the Program and Erase operations.

The Status Read function is used to monitor the Ready/Busy status of the device, determine the result (pass

/fail) of a Program or Erase operation, and determine whether the device is in Protect mode. The device status is

output via the I/O port using RE after a “70h” command input. The Status Read can also be used during a

Read operation to find out the Ready/Busy status.

The resulting information is outlined in Table 6.

Table 6. Status output table

Definition

Page Program

Block Erase

Read

Chip Status1

I/O1

Pass: 0

Fail: 1

Pass/Fail

Invalid

I/O2

Not Used

Invalid

Invalid

I/O3

Not Used

0

0

I/O4

Not Used

0

0

I/O5

Not Used

0

0

I/O6

Ready/Busy

Ready: 1

Busy: 0

Ready/Busy

Ready/Busy

I/O7

Ready/Busy

Ready: 1

Busy: 0

Ready/Busy

Ready/Busy

I/O8

Write Protect

Write Protect

Not Protected :0 Protected: 1

Write Protect

I/O9 to 16 Not used

Not used

Not used

The Pass/Fail status on I/O1 is only valid during a Program/Erase operation when the device is in the Ready state.

25

2003-10-30A

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