TC58DVM92A1FTI0 View Datasheet(PDF) - Toshiba

Part Name

Description

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TC58DVM92A1FTI0

TOSHIBA MOS DIGITAL INTEGRATED CIRCUIT SILICON GATE CMOS

Toshiba 

TC58DVM92A1FTI0

(14) Invalid blocks (bad blocks)

The device contains unusable blocks. Therefore, at the time of use, please check whether a block is bad and

do not use these bad blocks.

Bad Block

Bad Block

At the time of shipment, all data bytes in a Valid Block are FFH. For Bad

Block, all bytes are not in the FFH state. Please don’t perform erase

operation to Bad Block.

Check if the device has any bad blocks after installation into the system.

Figure 27 shows the test flow for bad block detection. Bad blocks which are

detected by the test flow must be managed as unusable blocks by the

system.

A bad block does not affect the performance of good blocks because it is

isolated from the Bit line by the Select gate

Figure 26.

The number of valid blocks at the time of shipment is as follows:

MIN

TYP.

MAX

UNIT

Valid (Good) Block Number

4016



4096

Block

Bad Block Test Flow

Start

Block No 1

Block No. Block No.  1

Read Check

Pass

Read Check: to verify the column address of

517bytes of the first page in the

block with FF (Hex)

Fail

Bad Block *1

No

Block No. 4096

Yes

End

*1: No erase operation is allowed to detected bad blocks

Figure 27

2003-07-11 42/44

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