MX27C1100(2003) View Datasheet(PDF) - Macronix International

Part Name

Description

View to exact match

MX27C1100
(Rev.:2003)

1M-BIT [128K x 8/64K x 16] CMOS EPROM

Macronix International 

SWITCHING TEST CIRCUITS

MX27C1100/27C1024

DEVICE

UNDER

TEST

CL

6.2K ohm

1.8K ohm

+5V

DIODES = IN3064

OR EQUIVALENT

CL = 100 pF including jig capacitance (30pF for 55/70ns parts)

SWITCHING TEST WAVEFORMS

AC driving levels

2.0V

0.8V

TEST POINTS

INPUT

AC TESTING: AC driving levels are 2.4V/0.4V .

Input pulse rise and fall times are <20ns.

2.0V

0.8V

OUTPUT

AC driving levels

1.5V

TEST POINTS

INPUT

AC TESTING: (1) AC driving levels are 3.0V/0V.

Input pulse rise and fall times are < 10ns.

(2) For MX27C1100/1024-55/70

1.5V

OUTPUT

P/N: PM0156

8

REV. 4.6, JAN. 14, 2003

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