HM62G18512 Series
TAP AC Characteristics (Ta = 0 to 70°C, [Tj max = 110°C])
Parameter
Symbol Min
Max
Unit Note
Test clock cycle time
t THTH
67
—
ns
Test clock high pulse width
t THTL
30
—
ns
Test clock low pulse width
t TLTH
30
—
ns
Test mode select setup
t MVTH
10
—
ns
Test mode select hold
t THMX
10
—
ns
Capture setup
t CS
10
—
ns
1
Capture hold
t CH
10
—
ns
1
TDI valid to TCK high
t DVTH
10
—
ns
TCK high to TDI don’t care
t THDX
10
—
ns
TCK low to TDO unknown
t TLQX
0
—
ns
TCK low to TDO valid
t TLQV
—
20
ns
Note: 1. tCS + tCH defines the minimum pause in RAM I/O pad transitions to assure pad data capture.
TAP Test Conditions
• Input pulse levels: 0 to 3.0 V
• Input and output timing reference levels: 1.5 V
• Input rise and fall time: 2 ns (10% to 90%) (typ)
• Output Load: See figure
DUT
TDO
Z0 = 50 Ω
VT = 1.5 V
50 Ω
17