MP3275 View Datasheet(PDF) - Exar Corporation

Part Name

Description

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MP3275

Fault Protected 16 Channel, 12-Bit Data Acquisition Subsystem

Exar Corporation 

DB N

3k

CL

a. High-Z to VON

DB N

+5 V

3k

CL

b. High-Z to VOL

Figure 3. Load Circuit for Data

Access Time Test

DB N

3k

10pF

MP3275

DB N

+5 V

3k

10pF

a. VON to High-Z

b. VOL to High-Z

Figure 4. Load Circuit for

Bus Relinquish Time Test

STL, STS

CL

DGND

Figure 5. Load Circuit for WR to STS Delay

Serial Data Output

The serial data output sequence is MSB (DB11) first to LSB

(DB0) last. The MSB (DB11) data bit appears at SDO when STS

goes low. The second most significant bit appears at SDO on

the SDC high-to-low transition next. The LSB (DB0) is present

at SDO on the 11th SDC high-to-low transition.

Further information regarding serial control and timing is

shown in Figure 6., Table 4. and Table 5.

For a minimum interconnect serial environment, the channel

address state can be generated in at least two ways, using an

address counter, or using an address serial to parallel converter.

WR can then be used as the counter clock or shift register load

signal as well as the A/D converter start convert signal on the ris-

ing edge. (Note that the falling edge loads the address present at

the address port.)

STS

SDCÇÇÇÇÇÇÇÇÇÇ t21

t22

t20

SDO

DB11 (MSB)

DB10

See Table 4

SDC should be in a high state during the STS high period. SDC can make the first high to low transition after t21.

Figure 6. Serial Data Mode Timing

Rev. 4.00

9

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