MC74LVX374 View Datasheet(PDF) - ON Semiconductor

Part Name

Description

View to exact match

MC74LVX374

Octal D-Type Flip-Flop with 3-State Outputs

ON Semiconductor 

MC74LVX374

ORDERING INFORMATION

Device

Package

Shipping†

MC74LVX374DWR2

SOIC−20

1000 Tape & Reel

MC74LVX374DWR2G

SOIC−20

(Pb−Free)

1000 Tape & Reel

MC74LVX374DTR2

TSSOP−20*

2500 Tape & Reel

MC74LVX374M

SOEIAJ−20

50 Units / Rail

MC74LVX374MG

SOEIAJ−20

(Pb−Free)

50 Units / Rail

MC74LVX374MEL

SOEIAJ−20

2000 Tape & Reel

MC74LVX374MELG

SOEIAJ−20

(Pb−Free)

2000 Tape & Reel

†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging

Specifications Brochure, BRD8011/D.

*This package is inherently Pb−Free.

CP

50%

tW

1/fmax

tPLH

tPHL

O

50% VCC

Figure 3.

D

CP

SWITCHING WAVEFORMS

VCC

OE

50%

GND

O

O

VALID

50%

tsu

th

50%

Figure 5.

tPZL

tPLZ

50% VCC

tPZH tPHZ

50% VCC

Figure 4.

VCC

GND

VCC

GND

VCC

GND

HIGH

IMPEDANCE

VOL +0.3V

VOH −0.3V

HIGH

IMPEDANCE

DEVICE

UNDER

TEST

TEST POINT

OUTPUT

CL*

TEST CIRCUITS

DEVICE

UNDER

TEST

TEST POINT

OUTPUT

1 kW

CL*

CONNECT TO VCC WHEN

TESTING tPLZ AND tPZL.

CONNECT TO GND WHEN

TESTING tPHZ AND tPZH.

*Includes all probe and jig capacitance

Figure 6. Propagation Delay Test Circuit

*Includes all probe and jig capacitance

Figure 7. Three−State Test Circuit

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