IS62C1024AL(2005) View Datasheet(PDF) - Integrated Silicon Solution
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Description
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IS62C1024AL Datasheet PDF : 11 Pages
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IS62C1024AL
IS65C1024AL
ISSI ®
IS62C1024AL/IS65C1024AL
POWER SUPPLY CHARACTERISTICS(1) (Over Operating Range)
Symbol Parameter
Test Conditions
-35 ns
-45 ns
Min. Max.
Min. Max.
Unit
ICC
Average operating
Current
CE1 = VIL, CE2 = VIH
VIN = VIH or VIL,
I I/O= 0 mA
Com.
— 25
mA
Ind.
— 30
Auto.
— 35
ICC1 VDDDynamicOperating VDD=Max.,CE1=VIL
Com.
— 30
mA
Supply Current
IOUT = 0 mA, f = fMAX
Ind.
— 35
VIN = VIH or VIL
Auto.
— 40
CE2 = VIH
typ.(2)
— 20
ISB1 TTLStandbyCurrent VDD=Max.,
Com.
—1
mA
(TTL Inputs)
VIN = VIH or VIL, CE1 ≥ VIH,
Ind.
— 1.5
or CE2 ≤ VIL, f = 0
Auto.
—2
ISB2 CMOSStandby
VDD = Max.,
Com.
—5
µA
Current(CMOSInputs) CE1 ≥ VDD – 0.2V, or
Ind.
— 10
CE2≤0.2V,VIN≥VDD–0.2V, Auto.
— 15
or VIN ≤ VSS + 0.2V, f = 0
typ.(2)
—4
Note:
1. At f = fMAX, address and data inputs are cycling at the maximum frequency, f = 0 means no input lines change.
2. Typical Values are measured at VDD = 5V, TA = 25oC and not 100% tested.
READ CYCLE SWITCHING CHARACTERISTICS(1) (Over Operating Range)
Symbol
tRC
tAA
tOHA
tACE1
tACE2
tDOE
tLZOE(2)
tHZOE(2)
tLZCE1(2)
tLZCE2(2)
tHZCE(2)
Parameter
-35 ns
-45 ns
Min. Max.
Min. Max.
Unit
Read Cycle Time
35
—
45
—
ns
Address Access Time
— 35
— 45
ns
Output Hold Time
CE1 Access Time
3
—
3
—
ns
— 35
— 45
ns
CE2 Access Time
OE Access Time
OE to Low-Z Output
— 35
— 45
ns
— 10
— 20
ns
3
—
5
—
ns
OE to High-Z Output
CE1 to Low-Z Output
0
10
0
15
ns
3
—
5
—
ns
CE2 to Low-Z Output
3
—
5
—
ns
CE1 or CE2 to High-Z Output
0
10
0
15
ns
Notes:
1. Test conditions assume signal transition times of 5 ns or less, timing reference levels of 1.5V, input pulse levels of
0.6 to 2.4V and output loading specified in Figure 1a.
2. Tested with the load in Figure 1b. Transition is measured ±500 mV from steady-state voltage. Not 100% tested.
4
Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774
Rev. C
01/24/05
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