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IKW25T120 View Datasheet(PDF) - Infineon Technologies

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IKW25T120 Datasheet PDF : 15 Pages
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IKW25T120
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TrenchStop Series
500ns
400ns
300ns
200ns
100ns
TJ=150°C
TJ=25°C
0ns
400A/µs 600A/µs 800A/µs 1000A/µs
diF/dt, DIODE CURRENT SLOPE
Figure 23. Typical reverse recovery time as
a function of diode current slope
(VR=600V, IF=25A,
Dynamic test circuit in Figure E)
5µC
TJ=150°C
4µC
3µC
2µC
TJ=25°C
1µC
0µC
400A/µs
600A/µs
800A/µs 1000A/µs
diF/dt, DIODE CURRENT SLOPE
Figure 24. Typical reverse recovery charge
as a function of diode current
slope
(VR=600V, IF=25A,
Dynamic test circuit in Figure E)
30A
TJ=150°C
25A
20A
TJ=25°C
15A
10A
5A
0A
400A/µs 600A/µs 800A/µs 1000A/µs
diF/dt, DIODE CURRENT SLOPE
Figure 25. Typical reverse recovery current
as a function of diode current
slope
(VR=600V, IF=25A,
Dynamic test circuit in Figure E)
-400A/µs
-300A/µs
TJ=25°C
TJ=150°C
-200A/µs
-100A/µs
-0A/µs
400A/µs 600A/µs 800A/µs 1000A/µs
diF/dt, DIODE CURRENT SLOPE
Figure 26. Typical diode peak rate of fall of
reverse recovery current as a
function of diode current slope
(VR=600V, IF=25A,
Dynamic test circuit in Figure E)
Power Semiconductors
11
Preliminary / Rev. 1 Jul-02

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