M54567P View Datasheet(PDF) - MITSUBISHI ELECTRIC
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M54567P Datasheet PDF : 4 Pages
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MITSUBISHI SEMICONDUCTOR <TRANSISTOR ARRAY>
M54567P/FP
4-UNIT 1.5A DARLINGTON TRANSISTOR ARRAY WITH CLAMP DIODE
RECOMMENDED OPERATING CONDITIONS (Unless otherwise noted, Ta = –20 ~ +75°C)
Symbol
Parameter
VCC
Supply voltage
VO
Output voltage
Collector current VCC = 5V, Duty Cycle
IC
(Current per 1 cir-
cuit when 4 circuits
are coming on si-
P : no more than 4%
FP : no more than 2%
VCC = 5V, Duty Cycle
P : no more than 18%
multaneously)
FP : no more than 9%
VIH
“H” input voltage
VIL
“L” input voltage
Limits
Unit
min
typ
max
4
5
6
V
0
—
50
V
0
—
1.25
A
0
—
0.7
VCC–0.5 —
VCC
V
0
— VCC–3.5 V
ELECTRICAL CHARACTERISTICS (Unless otherwise noted, Ta = –20 ~ +75°C)
Symbol
Parameter
Test conditions
Limits
min
typ+
Unit
max
V (BR) CEO Collector-emitter breakdown voltage ICEO = 100µA
50
—
—
V
ICC
Supply current (One circuit coming on) VCC = 6V, VI = 0.5V
—
3.0
4.5 mA
VCC = 4V, VI = 0.5V, IC = 1.25A
VCE (sat) Collector-emitter saturation voltage
VCC = 4V, VI = 0.5V, IC = 0.7A
—
1.6
2.2
—
1.1
1.7
V
II
Input current
VI = VCC–3.5V
VI = VCC–6V
—
–0.3 –0.6
mA
—
–0.58 –0.95
IR
Clamping diode reverse current VR = 50V
—
—
100 µA
VF
Clamping diode forward voltage IF = 1.25A, VCC open
—
1.6
2.3 V
hFE
DC amplification factor
VCC = 4V, VCE = 4V, IC = 1A, Ta = 25°C
4000 30000
—
—
+ : The typical values are those measured under ambient temperature (Ta) of 25°C. There is no guarantee that these values are obtained under any
conditions.
SWITCHING CHARACTERISTICS (Unless otherwise noted, Ta = 25°C)
Symbol
Parameter
ton
Turn-on time
toff
Turn-off time
Test conditions
CL = 15pF (note 1)
Limits
Unit
min
typ
max
—
190
—
ns
—
5300
—
ns
NOTE 1 TEST CIRCUIT
TIMING DIAGRAM
INPUT
PG
50Ω
VCC
VO
Measured device
RL
OPEN
OUTPUT
CL
INPUT
50%
OUTPUT
50%
ton
(1) Pulse generator (PG) characteristics : PRR = 1kHz,
tw = 10µs, tr = 6ns, tf = 6ns, ZO = 50Ω
VI = 0.5 to 4V
(2) Input-output conditions : RL = 8.3Ω, VO = 10V, VCC = 4V
(3) Electrostatic capacity CL includes floating capacitance at
connections and input capacitance at probes
50%
50%
toff
Aug. 1999
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