CA3127M View Datasheet(PDF) - Intersil
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Description
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CA3127M Datasheet PDF : 7 Pages
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Test Circuits
CA3127
V+
10kΩ
BIAS-CURRENT
ADJ
470
RL
pF 0.01
µF 1µF
2
VO
51Ω
6
4
Q2
0.01µF
8
Q3 470pF
3
1µF
470pF
0.01
µF
7
VI GEN
FIGURE 1. VOLTAGE-GAIN TEST CIRCUIT USING CURRENT-MIRROR BIASING FOR Q2
SHIELD
C2
12
(NOTE 5)
VI 1000pF
0.3µH
4
1.8pF C1
(NOTE 5)
Q5
14
2
13 620Ω
1000
pF
Q2
560Ω
3
OHMITE
Z144
8
6
25kΩ
Q3
1000 7
5
pF
1.5 - 8pF
VO
8.2
kΩ 0.47µH
1000
pF
TEST
POINT
750Ω
1%
NOTES:
1000
pF
+12V
4. This circuit was chosen because it conveniently repre-
sents a close approximation in performance to a proper-
ly unilateralized single transistor of this type. The use of
Q3 in a current-mirror configuration facilitates simplified
biasing. The use of the cascode circuit in no way implies
that the transistors cannot be used individually.
5. E.F. Johnson number 160-104-1 or equivalent.
FIGURE 2. 100MHz POWER-GAIN AND NOISE-FIGURE TEST CIRCUIT
GENERAL RADIO 1021-P1
100MHz GENERATOR
ATTN
100MHz
TEST SET
BOONTON 91C
RF VOLTMETER
12VDC
POWER SUPPLY
FIGURE 3A. POWER GAIN SET-UP
VHF NOISE SOURCE
HEWLETT PACKARD HP343A
100MHz
TEST SET
100MHz
POST AMPLIFIER
NOISE FIGURE METER
HEWLETT PACKARD HP342A
12VDC
POWER SUPPLY
15VDC
POWER SUPPLY
FIGURE 3B. NOISE FIGURE SET-UP
FIGURE 3. BLOCK DIAGRAMS OF POWER-GAIN AND NOISE-FIGURE TEST SET-UPS
5-3
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